This Special session is organised and leading by the IMEKO Technical Committee TC25 Quantum Measurement and Quantum Information as joint event to this Symposium.
The aim of TC25 is to provide a forum to discuss advances in quantum-based measurement, the quantum technologies they support, and the changes they imply for the international metrology infrastructure and for applications. Topics include:
- Latest trends and best practices in quantum-based measurements across multiple disciplines;
- How quantum technology in combination with the redefinition of the SI is changing the face of the realization and dissemination of measurement standards and services;
- Readiness of various quantum measurement technologies and prospects for future standardization;
- Connection between quantum information and quantum metrology, such as the use of quantum states for measurement;
- Identification and communication of technical advances and novel applications that are made possible by quantum enhanced metrology. This includes discussion of use cases, and examples and limitations of quantum technology;
- Creating a foundation for international acceptance and mutual recognition of field-deployable and chip-scale quantum-based standards.
New measurement technologies will be required to support the breadth of technologies being developed, such as computers based on superconducting qubits or ion traps, and quantum-enhanced networking.
During this Symposium three sessions and other activities, like keynote talks given by eminent scientists, round tables and/or exhibitions, will be devoted to:
- Metrology for computing
- Metrology for networking
- Metrology for sensing